Ieee Transactions On Semiconductor Manufacturing高引用文章

• Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network

  引用次数：41

• Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks

  引用次数：24

• Hybrid Particle Swarm Optimization Combined With Genetic Operators for Flexible Job-Shop Scheduling Under Uncertain Processing Time for Semiconductor Manufacturing

  引用次数：23

• Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class

  引用次数：22

• AdaBalGAN: An Improved Generative Adversarial Network With Imbalanced Learning for Wafer Defective Pattern Recognition

  引用次数：15

• A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing

  引用次数：15

• Epitaxial beta-Ga2O3 and beta-(AlxGa1-x)(2)O-3/beta-Ga2O3 Heterostructures Growth for Power Electronics

  引用次数：15

• Decision Tree Ensemble-Based Wafer Map Failure Pattern Recognition Based on Radon Transform-Based Features

  引用次数：13

• A Data Driven Cycle Time Prediction With Feature Selection in a Semiconductor Wafer Fabrication System

  引用次数：12

• Deep-Structured Machine Learning Model for the Recognition of Mixed-Defect Patterns in Semiconductor Fabrication Processes

  引用次数：12